Ronald R. Willey
Expert Forensic Witness in Optical Thin Films Design and Production,
and Optical Systems

With more than five decades of Technical Experience and Training in the Technical Field of Optics, Mr. Willey has broad Technical Expertise. Recognizing that Forensic Witnessing is the other part of being an Effective Expert Witness, he has worked to expand his Expertise as a Witness. He has studied the following texts and watched all of the pertinent Webinars offered by The TASA Group, Inc. on aspects of being an Expert Witness:

Robert J. Crawford, The Expert Witness, 1st Books Library, Fairfield, CA (2001).

Dan Poynter, Expert Witness Handbook, Para Publishing, Santa Barbara, CA (2005).

Stanley L. Brodsky, The Expert Expert Witness, American Psychological Association, Washington, DC (2006).


EXPERT WITNESS CASES:

Thin Film Labs, Inc. (TFL) vs. Universal Thin Film Labs, Inc. (UTFL), IP case; represented the court, site investigations and studies, gave deposition, testified in trial.

Baker v. Houston, California insurance case; functioned as consulting expert, case settled.

Astrium, et al. v. Pilkington Optronics, optical coatings case; did extensive document review and research, the case was put on hold.

Honeywell International, Inc., v. United States of America, Lockheed Martin Corporation, and L-3 Communications Corporation. Patent infringement case. Gave deposition. Prepared to testify and attended trial, but did not testify.

Red Com, Inc.,(dba Red Digital Camera) v. UniqOptics, LLC. Intellectual Property Infringement case. Gave deposition, testified at mediation.

Please e-mail us at:   ron@willeyoptical.com  or call (231) 237-9392.

Also listed with www.xprolegal.com

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